1. scan design Or "Scan-In, Scan-Out" A electronic circuit design technique which aims to increase the controllability and observability of a digital logic circuit by incorporating special "scan registers" into the circuit so that they form a scan path. Some of the more common types of scan design include the multiplexed register designs and level-sensitive scan design LSSD used extensively by IBM. Boundary scan can be used alone or in combination with either of the above techniques. ["Digital Systems Testing and Testable Design" by Abramovici, Breuer, and Friedman, ISBN 0-7167-8179-4]. ["Design of Testable Logic Circuits" by R. G. Bennetts, Brunel/Southhampton Universities, ISBN 0-201-14403-4].
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